On June 3rd of 2015, the expert of microscopy Maria Marosvoelgyi from FEI (www.fei.com) gave a lecture of Correlative Light and Electron Microscopy (CLEM) technology at Institute of Genetics and Developmental Biology, Chinese Academy of Sciences. This technology combines high resolution of capturing ultra-structural details by electron microscopy (EM) with molecule labeling function of fluorescence microscopy (FM), so that cell biologists can understand the dynamic conditions of macromolecule in living cells, and get more information of sub-cellular structure. The guests came from Genetics Institute, Developmental Center, Microorganism Institute and Animal Institute. We discussed about application of TIRF (Total Internal Reflection Fluorescence imaging), SEM (Scanning Electron Microscopy ) and fluorescence study of thick plant samples, and FIB application (Iron Beam cutting), etc.